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VLSI Test Principles and Architectures: Design for Testability

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VLSI Test Principles and Architectures: Design for Testability by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen

MK | 2006 | ISBN: 0123705975 | 808 pages | PDF | 16 MB

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

• Most up-to-date coverage of design for testability.
• Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
• Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
• Lecture slides and exercise solutions for all chapters are now available.
• Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.

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